Techniques and Capabilities
LABMET offers the scientific community and the productive sector specialized services in nanomaterial characterization using TEM/STEM electron microscopy, focused on research and development of advanced materials.
The laboratory features state-of-the-art infrastructure and highly qualified personnel, enabling morphological, structural, and compositional analyses at the nanometric scale under high standards of quality and scientific rigor. In this way, LABMET reaffirms its commitment to excellence, interinstitutional collaboration, and support for R&D&I projects in the field of nanomaterials.
🔬 TEM and STEM Images with Atomic Resolution
These enable obtaining structural information at the atomic level through multiple imaging modes, providing detailed data on composition and crystalline structure. They are essential for the study of nanomaterials, where small structural variations can significantly affect their properties.
EDS Composition Maps
Elemental analysis technique based on characteristic X-rays generated by the electron beam, which allows visualizing the distribution of elements through high-resolution two-dimensional maps.
📊 4D-STEM
Enables acquiring diffraction patterns at each point of the sample, generating multidimensional data that facilitate the analysis of atomic structure, defects, deformations, and electronic properties with high precision.
⚡ Electric and Magnetic Fields Using DPC
Advanced technique that allows visualizing and mapping electromagnetic fields at the micro and nanoscale from electron beam deflection.
🎯 STEM with Segmented Detector
Segmented detection allows recording differentiated angular signals from transmitted electrons, generating images with complementary contrasts and facilitating advanced analyses of the sample’s internal structure.
